CWE-1319: Improper Protection against Electromagnetic Fault Injection (EM-FI)
Description
The device is susceptible to electromagnetic fault injection attacks, causing device internal information to be compromised or security mechanisms to be bypassed.
Electromagnetic fault injection may allow an attacker to locally and dynamically modify the signals (both internal and external) of an integrated circuit. EM-FI attacks consist of producing a local, transient magnetic field near the device, inducing current in the device wires. A typical EMFI setup is made up of a pulse injection circuit that generates a high current transient in an EMI coil, producing an abrupt magnetic pulse which couples to the target producing faults in the device, which can lead to: Bypassing security mechanisms such as secure JTAG or Secure Boot Leaking device information Modifying program flow Perturbing secure hardware modules (e.g. random number generators)
- Abstraction
- BaseA weakness specific enough to point to detection and prevention methods.
- Likelihood of exploit
- Not rated by MITRE
- Status
- Incomplete
Common consequences
- ConfidentialityIntegrityAccess ControlAvailability
Modify Memory; Read Memory; Gain Privileges or Assume Identity; Bypass Protection Mechanism; Execute Unauthorized Code or Commands
Potential mitigations
- Architecture and DesignImplementation
1. Redundancy - By replicating critical operations and comparing the two outputs can help indicate whether a fault has been injected. 2. Error detection and correction codes - Gay, Mael, et al. proposed a new scheme that not only detects faults injected by a malicious adversary but also automatically corrects single nibble/byte errors introduced by low-multiplicity faults. 3. Fail by default coding - When checking conditions (switch or if) check all possible cases and fail by default because the default case in a switch (or the else part of a cascaded if-else-if construct) is used for dealing...